top of page

Scanning Electron Microscopy (SEM)

Buy Now the Hard Copy of notes for seamless and ad-free learning, Click Below!

Principle

  • Scanning Electron Microscopy SEM scans a focused electron beam across the specimen’s surface. Secondary electrons emitted from the specimen surface are collected to form an image.

  • SEM provides high-resolution, three-dimensional images that reveal the specimen's surface topology.

Procedure for SEM

Specimen Preparation

  • Fixation: The specimen is fixed to preserve its structure, similar to TEM.

  • Dehydration: Critical point drying is used to prevent the collapse of structures caused by surface tension.

  • Mounting: The specimen is attached to an aluminum stub using conductive adhesives.

  • Coating: A thin layer of conductive metal (e.g., gold or platinum) is sputter-coated on the specimen to prevent charging and improve signal quality.

Operation of the SEM

  • Vacuum System: The specimen chamber is evacuated to reduce electron scattering.

  • Electron Source: An electron beam is generated using a thermionic or field emission gun.

  • Beam Focusing: Electromagnetic lenses are used to focus the electron beam into a fine spot.

  • Scanning: The electron beam is raster-scanned over the specimen’s surface.

Detection and Imaging

  • Secondary Electron Detector: Secondary electrons emitted from the specimen are collected.

  • Image Formation: The intensity of these electrons is used to form a grayscale image displayed on a monitor.

Image Processing

  • Adjustments: Brightness, contrast, and focus are modified for optimal image quality.

  • Data Capture: Images are saved digitally for further analysis.

Applications

  • Surface Morphology: Studying the texture and topography of materials.

  • Biology: Examining surface structures of cells and tissues.

  • Nanotechnology: Visualizing nanoparticles and nanostructures.

Advantages

  • High-resolution imaging of surfaces.

  • Depth of field allows for 3D-like visualization.

  • No need for ultra-thin specimens.

Limitations of Scanning Electron Microscopy

  • Internal structures cannot be viewed.

  • Non-conductive specimens require a conductive coating.

  • Specimens must withstand vacuum conditions.

Buy Now the Hard Copy of notes for seamless and ad-free learning, Click Below!


Related Posts

See All
Dark Field Microscopy

Buy Now the Hard Copy of notes for seamless and ad-free learning, Click Below! Dark field microscopy enhances the contrast of transparent...

 
 
 
bottom of page